What spring contact probes are and what they are for

The name Spring Contact Probe comes from the device that connects the DUT (device under test) with the electronics of the test machine, also called Contact Probe, Test Probe, Spring Probe or Pogo Pin.

They are used in two different ways:

Spring Contact Probe for in-circuit test (ICT)

Spring Contact Probes are essential precision elements for the connection between the DUT and the test machine, in order to collect data during the in-circuit test (ICT).

In this phase the main need is to test a printed circuit board (PCB) by checking the different parameters of the components of the electrical circuit, such as the resistance / impedance, the presence of the component itself and whether or not there are short circuits;

Spring Contact Probe for Functional Test (FCT)

Spring Contact Probes are also used to perform functional tests (FCT), during which the actual operation of the DUT is verified under conditions almost equal to the actual working conditions.
At this stage, one of the values that can be checked is the functionality of the power supply line of the DUT itself.
For the success of the test process, there are different types of Spring Contact Probes, which vary in total length, installation method, grid size, head shape, spring load and type of connection.

The technical characteristics of the Spring contact probes are:

Contact us

Call us!
+39 045 602 0916

 Email us!
This email address is being protected from spambots. You need JavaScript enabled to view it.

Fill the form!
To get a quick response

Please let us know your name.
Please let us know your email address.
Please let us know your request.
Invalid field
Valore non valido


Download our catalog to get more information about our standard products


Tecon srl  | P.IVA 03780900233 | REA: VR-365047 | Cap. Soc. € 60.000 i.v.

Privacy Policy | Cookie Policy | Website by Third Eye