Technical data
Materials and galvanic
Head shape
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ICT-FCT Standard Probes

The ICT (In-Circuit Test) and the FCT (Functional Circuit Test) allow to detect the main faults that can be found in a PCB (Printed Circuit Board), such as short circuit sor an incorrect component, and to measure the values of resistance and capacity.

Thanks to the Spring Contact Probe, which connects the DUT (Device Under Test) with the electronics of the test machine, you can solve frequent problems with ease and speed.

Dimensions, head shape, spring load, construction materials and galvanic finish are the characteristics that make Spring Contact Probe suitable for the various types of surfaces.


Spring Contact Probe for in-circuit test (ICT)

Spring Contact Probes are essential precision elements for the connection between the DUT and the test machine, in order to collect data during the in-circuit test (ICT).

In this phase the main need is to test a printed circuit board (PCB) by checking the different parameters of the components of the electrical circuit, such as the resistance / impedance, the presence of the component itself and whether or not there are short circuits;


Spring Contact Probe for Functional Test (FCT)

Spring Probes are also used to perform functional tests (FCT), during which the actual operation of the DUT is verified under conditions almost equal to the actual working conditions.
At this stage, one of the values that can be checked is the functionality of the power supply line of the DUT itself.

For the success of the test process, there are different types of Spring Probes, which vary in total length, installation method, grid size, head shape, spring load and type of connection.

Technical data of Spring Contact Probes

Recommended minimum distance (grid-pitch)

Our standard range of Spring Contact Probe for ICT/FCT can be used within various installation distances ranging from 1.27 mm to 5,08 mm.

Current rating

The standard current of Tecon Spring Contact Probes ranges from 2 to 13 A, depending on the type of material used and the technical specifications adopted in their making.

To meet the need to test with higher currents, there are High Current Probes.


Typical contact resistance

Depending on the various types of Spring Contact Probe, their typical contact resistance ranges from 14 mΏ to 50 mΏ.

Materials and plating of Spring Contact Probes for ICT and FCT

The Spring Contact Probes for ICT/FCT consists of a barrel, spring and plunger.

The barrel can be made in:

Materiale: bronzo


material with good hardness and workability characteristics

Materiale: ottone


material with excellent electrical conductivity and workability, but not as hard as bronze

Nickel argento

Nickel silver

This alloy is widely used for its workability with punching techniques and for its good electrical characteristics.

Subsequently, all barrels are gold plated through a galvanic process.

The spring is made of music wireel and is also gold plated to improve its electrical conductivity. Its load capacity ranges from 100 to 400 gr on standard contacts, but it can decrease or increase depending on the customer’s needs.

The plunger can be built in:

Copper Beryllium


The galvanic plating process can be carried out in gold, silver or nickel, and it need to be carried out with the maximum precision, because it will make it possible to improve the durability, conductivity and resistance of the plunger.


For the standard dimensions of our Spring Contact Probes the receptacle can be of various types:



to weld the wire directly in the receptacle



for crimping the wire inside the receptacle

Wrap the thread


to wrap the wire around the square end of the receptacle

Round Post

Round Post

to insert the termination of the receptacle in a special place

As for the height of the swelling on the receptacle that determines the height of installation, we are at our customers’ disposal to understand their needs and requirements, since all our products can be customized and made specifically for personal projects.

In addition, the retaining imprints on the receptacle wall can also be customised, allowing the Spring Contact Probe to be firmly inserted into the receptacle.

Head shape of Spring Contact Probes

There are many standard Spring Contact Probes head shapes to meet all our customers’ needs, only in some cases they depend on the diameter of the head itself.

Here are the standard types of heads we make:


Download the technical data sheet in pdf format and consult the technical details of the product.

Download catalogue

ICT-FCT Standard Probes

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